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Open Data
  • About GDIP
    • The History of GDIP
    • Who We Are
    • General Director
    • Structure
    • Supervisory Council
    • Board of Appeals
    • The Chamber for Revocation and Invalidity
    • Opposition Chamber
    • Evaluation Commission
    • Quality Policy
    • Contact
  • IP Objects
    • Patents
    • Utility Models
    • Trademarks
    • Industrial Designs
    • Geographical Indicators
    • Designations of Origin
    • Topography of Semiconductor Products
    • Information on Supplementary Protection Certificates (SPCs)
  • Legislation
    • National Legislation
    • International Agreements
    • The National Intellectual Property Strategy
    • Repealed Acts
  • E-Services
    • E-filing
      • National Protection
      • International Protection
        • e-albania
        • Epo
        • Wipo
        • Euipo
    • Register of Industrial Property Objects
    • Register of Authorized Representatives
    • International Classifications
    • Register of Experts of Industrial Property
  • Training Center
    • About the Center
    • Training Programs
    • Technical-Scientific Centers
    • Register of the Center's Lecturers
    • Activities of the Center
    • World Intellectual Property Day
  • Publications
    • Annual Report
    • Magazine
    • Monthly Calendar
    • Miscellaneous Publications
  • Agreement
    • National Cooperation Agreement
    • International Cooperation Agreement
    • Foreign Organizations
  • Newsroom
    • News
    • Notices
    • Authorized Representatives
      • Trademarks
      • Patents
    • Invitation
    • Gallery
    • Scholarship
  • Transparency
  • sq
  • About GDIP
    • The History of GDIP
    • Who We Are
    • General Director
    • Structure
    • Supervisory Council
    • Board of Appeals
    • The Chamber for Revocation and Invalidity
    • Opposition Chamber
    • Evaluation Commission
    • Quality Policy
    • Contact
  • IP Objects
    • Patents
    • Utility Models
    • Trademarks
    • Industrial Designs
    • Geographical Indicators
    • Designations of Origin
    • Topography of Semiconductor Products
    • Information on Supplementary Protection Certificates (SPCs)
  • Legislation
    • National Legislation
    • International Agreements
    • The National Intellectual Property Strategy
    • Repealed Acts
  • E-Services
    • E-filing
      • National Protection
      • International Protection
        • e-albania
        • Epo
        • Wipo
        • Euipo
    • Register of Industrial Property Objects
    • Register of Authorized Representatives
    • International Classifications
    • Register of Experts of Industrial Property
  • Training Center
    • About the Center
    • Training Programs
    • Technical-Scientific Centers
    • Register of the Center's Lecturers
    • Activities of the Center
    • World Intellectual Property Day
  • Publications
    • Annual Report
    • Magazine
    • Monthly Calendar
    • Miscellaneous Publications
  • Agreement
    • National Cooperation Agreement
    • International Cooperation Agreement
    • Foreign Organizations
  • Newsroom
    • News
    • Notices
    • Authorized Representatives
      • Trademarks
      • Patents
    • Invitation
    • Gallery
    • Scholarship
  • Transparency
  • sq
Blog
Home Kartela Informative Kërkesë për inspektim dosje për objektet e PI (marka, patenta, certifiakë të mbrojtjes shtesë, model përdorimi, tregues gjeografikë, disenjo industriale, emërtime të origjinës dhe topografi të produkteve gjysmëpërçuese)
Kartela Informative
admin September 3, 2020

Kërkesë për inspektim dosje për objektet e PI (marka, patenta, certifiakë të mbrojtjes shtesë, model përdorimi, tregues gjeografikë, disenjo industriale, emërtime të origjinës dhe topografi të produkteve gjysmëpërçuese)

Shkarko dokumentin

71
Kërkesë për doreheqje nga topografia e produkteve gjysmëpërçuesSeptember 3, 2020
Kërkesë për hetim për certifikatë të mbrojtjes shtesëSeptember 3, 2020

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